DocumentCode :
2598637
Title :
Optimization And Reliability Of Epitaxial Lift-off For OEIC Fabrication
Author :
Pollentier, I. ; Demeester, P. ; Van Daele, P. ; Martens, L.
Author_Institution :
University of Gent
fYear :
1992
fDate :
July 29 1992-Aug. 12 1992
Keywords :
Fabrication; MESFETs; Optoelectronic devices; Reproducibility of results; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, Smart Pixels, LEOS 1992 Summer Topical Meeting Digest on
Conference_Location :
Santa Barbara, CA, USA
Type :
conf
DOI :
10.1109/LEOSST.1992.697473
Filename :
697473
Link To Document :
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