High-Speed, single-cycle-resolution reliability system for RF-MEMS switches

Summary form only given, as follows. This paper presents a novel platform for high speed, single cycle resolution lifetime testing of RF-MEMS switches. The platform utilizes an FPGA control with switch cycling speed up to 45 kHz. Multiple real-time resistance measurements are made each cycle, allowing the accurate detection of intermittent failures. The results indicate that brief intermittent failures can occur hundreds of millions of cycles before end of life failure, which illustrates the need for single cycle resolution.