DocumentCode :
25989
Title :
Compact Models of Voltage Drops in Power Delivery Network for TSV-Based Three-Dimensional Integration
Author :
Huanyu He ; Jian-Qiang Lu
Author_Institution :
Dept. of Electr., Comput., & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
34
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
438
Lastpage :
440
Abstract :
This letter reports on compact models of voltage (IR) drops in a power delivery network (PDN) for through-silicon-via-based 3-D integration and packaging. The 3-D PDN is modeled with SPICE to investigate the dc voltage distribution in 3-D chip stacks. Analytical formulas are derived for estimating voltage drops for two typical types of vertical interconnect arrangements: uniform and peripheral distributions. With good agreements, analytical calculations reveal that the voltage drop has a quadratic correlation with the number of chips in a stack. The compact models provide important insights of 3-D PDNs for 3-D system design.
Keywords :
SPICE; electric potential; integrated circuit packaging; three-dimensional integrated circuits; SPICE; TSV-based three-dimensional integration; packaging; power delivery network; through-silicon-via; voltage drops; Integrated circuit modeling; Packaging; Power grids; Solid modeling; Through-silicon vias; 3-D integration; $IR$ drop; modeling; packaging; power delivery network (PDN); through-silicon via (TSV);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2238214
Filename :
6419754
Link To Document :
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