• DocumentCode
    2599041
  • Title

    Burn-in temperature projections for deep sub-micron technologies

  • Author

    Semenov, Oleg ; Vassighi, Annan ; Sachdev, Manoj ; Keshavarzi, Ali ; Hawkins, C.F.

  • Author_Institution
    University of Waterloo
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    95
  • Lastpage
    104
  • Keywords
    CMOS technology; Clocks; Energy consumption; Frequency; Integrated circuit testing; Leakage current; Microprocessors; Semiconductor device measurement; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270829
  • Filename
    1270829
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2599041