Title :
Microwave to terahertz characterization of carbon nanotube materials
Author :
Wu, Ziran ; Wang, Lu ; Zimmerman, Ian ; Xin, Hao
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Arizona, Tucson, AZ, USA
Abstract :
Microwave to THz characterizations of standalone MWNT paper and SWNT and few-layer-graphene thin films on glass substrates are presented. The MWNT paper is treated as an effective medium and its complex permittivity and permeability are extracted from both transmission and reflection measurements done in microwave and THz regimes. The results from these two different frequency ranges agree well. Due to its much smaller thickness compared to the characterization wavelength, the SWNT and graphene films are treated as a boundary condition with finite surface conductivity at the air-substrate interface. Their surface conductivities are extracted from the characterization, and show good consistency with reported values in literature at DC and optical frequency ranges. This surface conductivity characterization method is also applied as a verification approach for a potential metallic SWNT removing process using microwave irradiation induced current.
Keywords :
carbon nanotubes; electrical conductivity measurement; graphene; magnetic permeability; microwave materials; permittivity; surface conductivity; terahertz wave spectra; thin films; C; MWNT; air-substrate interface; carbon nanotube materials; finite surface conductivity; glass substrates; layer-graphene thin films; metallic SWNT removing process; microwave characterization; microwave irradiation; permeability; reflection measurements; surface conductivity characterization method; terahertz characterization; transmission measurements; Carbon nanotubes; Conductivity; Films; Glass; Microwave measurements; Microwave theory and techniques; Substrates; MWNT; Microwave; SWNT; Terahertz; carbon nanotube; graphene;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2011 IEEE 11th Topical Meeting on
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-8060-9
DOI :
10.1109/SIRF.2011.5719320