Title :
Economics in design and test
Author :
Dislis, C. ; Ambler, A.P. ; Dear, I.D. ; Dick, J.H.
Author_Institution :
Brunel Univ., Uxbridge, UK
Abstract :
The issue of economics in design and test is a very troubled and turbulent one. Even amongst our accepted testability experts, there can be widely differing opinions as to the implications of design and test decisions at an economic level, e.g. the continuing debate on full scan vs. partial scan. The paper outlines some of the testability issues facing IC and system designers, especially the costs involved in making circuits testable
Keywords :
economics; integrated circuit manufacture; integrated circuit testing; economic level; economics; system designers; testability experts; testability issues; Circuit faults; Circuit testing; Costs; Electronic circuits; Electronic equipment testing; Integrated circuit testing; Manufacturing; Production systems; System testing; Thumb;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-4230-0
DOI :
10.1109/ICCD.1993.393347
