DocumentCode

2599287

Title

The Role of Metallography in the Analysis of Failures of Electronic Components

Author

Coons, William C.

Author_Institution

Lockheed Missiles & Space Company, 3251 Hanover Street, Palo Alto, California

fYear

1965

fDate

Nov. 1965

Firstpage

32

Lastpage

45

Keywords

Aerospace materials; Circuits; Electron microscopy; Electronic components; Failure analysis; Glass; Laboratories; Missiles; Optical microscopy; Steel;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1965.362313

Filename

4207670