Title :
Cumulative Degradation Model and its Application to Component Life Estimation
Author_Institution :
Electrotechnical Laboratory, Ministry of International Trade and Industry, Nagata-cho, Tokyo, Japan
Abstract :
It is quite important to find a general degradation model for prediction and acceleration of component life under any stress condition, both for constant and variable stress conditions. For this purpose, the reaction theory gives a most powerful basis. Under the assumption of cumulative degradation, a general degradation model which is essentially applicable not only to electrical components but also to mechanical elements has been developed. The validity of the model has been investigated by experiments of some electronic components. Applications of this principle to component life estimation are also illustrated.
Keywords :
Degradation; Life estimation; Radio frequency;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362316