• DocumentCode
    2599324
  • Title

    Cumulative Degradation Model and its Application to Component Life Estimation

  • Author

    Shiomi, Hiroshi

  • Author_Institution
    Electrotechnical Laboratory, Ministry of International Trade and Industry, Nagata-cho, Tokyo, Japan
  • fYear
    1965
  • fDate
    16-18 Nov. 1965
  • Firstpage
    74
  • Lastpage
    94
  • Abstract
    It is quite important to find a general degradation model for prediction and acceleration of component life under any stress condition, both for constant and variable stress conditions. For this purpose, the reaction theory gives a most powerful basis. Under the assumption of cumulative degradation, a general degradation model which is essentially applicable not only to electrical components but also to mechanical elements has been developed. The validity of the model has been investigated by experiments of some electronic components. Applications of this principle to component life estimation are also illustrated.
  • Keywords
    Degradation; Life estimation; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1965.362316
  • Filename
    4207673