Title :
Failure Mechanisms of Electronic Components
Author :
Church, H.F. ; Roberts, B.C.
Author_Institution :
The Electrical Research Association, Leatherhead, Surrey, England
Keywords :
Assembly; Capacitors; Chemicals; Dielectric materials; Electronic components; Failure analysis; Manufacturing; Moisture; Resistors; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362319
