• DocumentCode
    2599384
  • Title

    Failure Mechanisms of Electronic Components

  • Author

    Church, H.F. ; Roberts, B.C.

  • Author_Institution
    The Electrical Research Association, Leatherhead, Surrey, England
  • fYear
    1965
  • fDate
    Nov. 1965
  • Firstpage
    156
  • Lastpage
    178
  • Keywords
    Assembly; Capacitors; Chemicals; Dielectric materials; Electronic components; Failure analysis; Manufacturing; Moisture; Resistors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1965.362319
  • Filename
    4207676