• DocumentCode
    2599535
  • Title

    Characterization of high resolution DAC by DFT and sine fitting

  • Author

    Carni, Domenico Luca ; Grimaldi, D.

  • Author_Institution
    Dept. of Electron., Comput. & Syst. Sci., Univ. of Calabria, Rende, Italy
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    1244
  • Lastpage
    1249
  • Abstract
    The research concerns with the evaluation of the dynamic performances of the DAC by analysing, in the frequency domain, the estimated output signal characterised by non uniform sampling. The non uniform sampling is caused by the method used to acquire the signal with both high resolution and linearity. On the basis of this characteristic, the signal processing in the frequency domain by tradition procedures brings non correct information. In order to overcome this problem two different analysis procedures are taken into account able to correctly process the non uniformly sampled signal. One is based on the discrete Fourier transform modified to be used in the case of non uniformly sampled signal. Another one is based on the multi-sine fitting algorithm modified according to the procedure presented in the paper. The performances of both the two analysis procedures are evaluated and highlighted. In particular, the accuracy of two analysis procedures is compared to evaluate the total harmonic distortion and the spurious free dynamic range in various experimental conditions.
  • Keywords
    digital-analogue conversion; discrete Fourier transforms; dynamic testing; harmonic distortion; signal resolution; signal sampling; DFT analysis; discrete Fourier transform; dynamic test; frequency domain procedure; high-resolution DAC characterization; multisine fitting algorithm; signal processing; signal sampling; spurious free dynamic range; total harmonic distortion; Discrete Fourier transforms; Frequency domain analysis; Frequency estimation; Linearity; Performance analysis; Performance evaluation; Signal analysis; Signal processing; Signal resolution; Signal sampling; DFT; Dynamic test; High resolution DAC; Sine fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168645
  • Filename
    5168645