DocumentCode
2599577
Title
An efficient and effective methodology on the multiple fault diagnosis
Author
Wang, Zhiyuan ; Tsai, Kun-Han ; Marek-Sadowska, Malgorzata ; Rajski, Janusz
Author_Institution
University of California
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
329
Lastpage
338
Keywords
Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computer graphics; Databases; Failure analysis; Fault diagnosis; Partitioning algorithms; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270855
Filename
1270855
Link To Document