Title :
An efficient and effective methodology on the multiple fault diagnosis
Author :
Wang, Zhiyuan ; Tsai, Kun-Han ; Marek-Sadowska, Malgorzata ; Rajski, Janusz
Author_Institution :
University of California
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computer graphics; Databases; Failure analysis; Fault diagnosis; Partitioning algorithms; Test pattern generators;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270855
