• DocumentCode
    2599598
  • Title

    Capacitive behavior of HF power transformers: Global approach to draw robust equivalent circuits and experimental characterization

  • Author

    Besri, A. ; Chazal, Herve ; Keradec, J.-P.

  • Author_Institution
    INPG, Lab. de Genie Electr. de Grenoble (G2Elab), UJF, St. Martin d´Heres, France
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    1262
  • Lastpage
    1267
  • Abstract
    This paper addresses the representation and the characterization of the electrostatic behavior of n-windings HF power transformers. A global approach, mainly based on energy considerations about linear electrostatic circuits, is introduced. It leads to equivalent circuits which include minimum numbers of elements. Besides, owing to a special approximation that is often acceptable, the general circuit can be greatly simplified and so it is for the experimental identification. This is discussed. Then, knowing the topology of the needed circuits, we show how to experimentally find the values of all involved components. This is achieved by using a wide frequency range impedance analyzer according to a well defined process. An industrial 3-winding transformer is used to illustrate this identification process and, finally, curves related to the equivalent circuit are compared to experimental ones.
  • Keywords
    equivalent circuits; high-frequency transformers; network topology; power transformers; transformer windings; capacitive behavior; circuit topology; impedance analyzer; industrial 3-winding transformer; linear electrostatic circuit; n-windings HF power transformer; Capacitance; Circuit faults; Electrostatics; Equivalent circuits; Frequency; Hafnium; Impedance measurement; Power transformers; Robustness; Transformer cores; HF power transformer; capacitance matrix; equivalent circuit; impedance measurements; stray capacitances;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168649
  • Filename
    5168649