Title :
A Simple Technique for the Direct Observation of Temperature Distribution in Microelectronic Structures
Author :
Howarth, Donald W.
Author_Institution :
Guidance and Control Systems Division, Litton Systems, Incorporated, Woodland Hills, California
Keywords :
Birefringence; Circuits; Coatings; Crystalline materials; Crystallization; Heat transfer; Microelectronics; Packaging; Power dissipation; Temperature distribution;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362331
