Title :
Radiochemical Study on Lateral Ion Migration in Insulating Substrates for Thin Film Microcircuits
Author_Institution :
Philco Applied Research Laboratory, Philco Corporation, Blue Bell, Pennsylvania
Keywords :
Electric resistance; Glass; Insulation; Isotopes; Motion detection; Resistors; Semiconductor thin films; Stress; Substrates; Transistors;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362336
