Radiochemical Study on Lateral Ion Migration in Insulating Substrates for Thin Film Microcircuits

Author

Choi, S.S.

Author_Institution

Philco Applied Research Laboratory, Philco Corporation, Blue Bell, Pennsylvania

fYear

1965

fDate

Nov. 1965

Firstpage

408

Lastpage

421

Keywords

Electric resistance; Glass; Insulation; Isotopes; Motion detection; Resistors; Semiconductor thin films; Stress; Substrates; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

DOI

10.1109/IRPS.1965.362336

Filename

4207693

Link To Document