DocumentCode

2599791

Title

Investigation of Surface Failure Mechanisms in Semiconductor Devices by Envelope Ambient Studies

Author

Brandewie, G.V. ; Eisenberg, P.H. ; Meyer, R.A.

Author_Institution

Autonetics, a Division of North American Aviation, Inc., Anaheim, California

fYear

1965

fDate

Nov. 1965

Firstpage

493

Lastpage

521

Keywords

Failure analysis; Neodymium; Semiconductor devices; Utility programs;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1965.362341

Filename

4207698