DocumentCode :
2599794
Title :
eSYSID: A proposal for a flexible electronic SYStem IDentification test bench
Author :
Vandersteen, Gerd ; De Locht, L. ; Schoukens, Johan
Author_Institution :
Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
1309
Lastpage :
1314
Abstract :
The experimental verification of identification techniques is the ultimate step in showing its qualities and weaknesses. For research purposes, the main problem is the reproduction of measurements done by other groups to validate a new method or excitation. For teaching purposes, on the other hand, it is extremely important that the students can put the system and/or method under study into different configurations. Having a realistic, reproducible and flexible test bench is, however, not an easy mission. This motivates the development of an electronic SYStem IDentification test bench (eSYSID). This paper provides a first architectural study of a digitally-programmable analog test bench. The analog system basically describes the nonlinear state-space equations using nonlinear functions and integrators. The initial architectural structure is described to give the potential users the ability to evaluate the possible use of the test bench. Hence, this paper can be seen as a study of the eSYSID under development, with the intention to gather realistic use-cases from various research groups in the field of instrumentation, measurement and identification.
Keywords :
benchmark testing; measurement errors; nonlinear equations; vectors; digitally-programmable analog test bench; eSYSID; flexible electronic system identification; measurements reproduction; nonlinear functions; nonlinear state-space equations; Differential equations; Electronic equipment testing; Flexible electronics; Hardware; Instruments; Nonlinear systems; Particle measurements; Proposals; System identification; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168658
Filename :
5168658
Link To Document :
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