Imperfections and Impurities in Silicon Associated with Device Surface Failure Mechanisms

Author

Forrester, J.E. ; Harris, R.E. ; Meinhard, J.E. ; Nolder, R.L.

Author_Institution

Autonetics, a Division of North American Aviation, Inc., Anaheim, California

fYear

1965

fDate

Nov. 1965

Firstpage

522

Lastpage

560

Keywords

Chromium; Delta modulation; Failure analysis; Impurities; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

DOI

10.1109/IRPS.1965.362342

Filename

4207699

Link To Document