• DocumentCode
    2600294
  • Title

    Petri net-based scheduling analysis of dual-arm cluster tools with wafer revisiting

  • Author

    Qiao, Yan ; Wu, NaiQi ; Zhou, MengChu

  • Author_Institution
    Dept. of Ind. Eng., Guangdong Univ. of Technol., Guangzhou, China
  • fYear
    2012
  • fDate
    20-24 Aug. 2012
  • Firstpage
    206
  • Lastpage
    211
  • Abstract
    With wafer revisit, it is complicated to schedule cluster tools in semiconductor fabrication. In wafer fabrication processes, such as atomic layer deposition (ALD), the wafers need to visit some process modules for a number of times. The existing swap-based strategy can be used to operate a dual-arm cluster tool for such a process. It results in a 3-wafer cyclic schedule. However, it is not optimal in the sense of cycle time. Thus, to search for a better schedule, a Petri net model is developed for a dual-arm cluster tool with wafer revisit. With it, the properties of the 3-wafer schedule are analyzed. It is found that, to improve the performance, it is necessary to reduce the number of wafers completed in a cycle. Thus, a 1-wafer schedule is developed by using a new swap-based strategy.
  • Keywords
    Petri nets; atomic layer deposition; machine tools; pattern clustering; scheduling; semiconductor device manufacture; wafer-scale integration; 3-wafer cyclic scheduling; ALD; Petri net-based scheduling analysis; atomic layer deposition; cluster tool scheduling; dual-arm cluster tool; dual-arm cluster tools; semiconductor fabrication; swap-based strategy; wafer fabrication processes; wafer revisiting; Firing; Load modeling; Robots; Schedules; Semiconductor device modeling; Steady-state; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2012 IEEE International Conference on
  • Conference_Location
    Seoul
  • ISSN
    2161-8070
  • Print_ISBN
    978-1-4673-0429-0
  • Type

    conf

  • DOI
    10.1109/CoASE.2012.6386329
  • Filename
    6386329