• DocumentCode
    2600340
  • Title

    X-tolerant compression and application of scan-atpg patterns in a bist architecture

  • Author

    Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay ; Amin, Minesh B.

  • Author_Institution
    Synopsys Inc.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    727
  • Lastpage
    736
  • Keywords
    Automatic logic units; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Logic devices; Logic testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270902
  • Filename
    1270902
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2600340