Title :
Characterization of sigma-delta modulators using ARMAX identification methods
Author :
Vandersteen, Gerd ; Jain, Manan ; Pintelon, Rik
Author_Institution :
Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
Abstract :
Sigma-delta modulators are becoming increasingly more popular in electronic circuits since they make optimal use of the high-speed capabilities of novel technologies. Such ΣΔ-modulators can be characterized via their signal and noise transfer function. These transfer functions are primarily used during the design of the modulators and hence, their pole/zero locations give valuable information about the system under test. The equivalent model with a signal and a noise transfer function is basically an ARMAX model. The identification of ARMAX systems is well studied under relatively general conditions. However, ΣΔ-modulators are designed such that they violate various of these general assumptions. This paper gives an overview of the properties of ΣΔ-modulators and compares the pros and contras of both time and frequency domain identification techniques for ARMAX systems. Finally, it is shown that only a modified frequency domain approach is capable to identify the ΣΔ-modulator. This technique is illustrated on a realistic low-pass ΣΔ-modulator, showing an excellent agreement between the estimated noise transfer function and the noise transfer function predicted using linear system theory.
Keywords :
equivalent circuits; frequency-domain analysis; sigma-delta modulation; transfer functions; ARMAX identification methods; electronic circuits; equivalent model; frequency domain identification techniques; linear system theory; low-pass ΣΔ-modulator; modified frequency domain approach; noise transfer function; pole/zero locations; sigma-delta modulators; signal transfer function; Bandwidth; Delta modulation; Delta-sigma modulation; Feedback loop; Filters; Frequency domain analysis; Linear systems; Signal design; Signal to noise ratio; Transfer functions;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168690