DocumentCode :
2600648
Title :
Random and systematic error analysis in the complex permittivity measurements of high dielectric strength thermoplastics
Author :
Rahman, Nayem ; Ayala, Ana ; Korolev, Konstantin A ; Afsar, Mohammed N. ; Cheung, Ray ; Aghion, Maurice
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
1568
Lastpage :
1573
Abstract :
This paper presents the complex dielectric permittivity and loss tangent measurements for a selection of advanced polymer-based thermoplastics in the Q-band, V-band and W-band frequencies and discusses in detail the random and systematic errors that arise in the experimental setup. These plastics are reported to have exceptional mechanical, thermal and electrical properties and are extensively used as electrical insulating materials, often operating at high voltages. With this view in mind, we have studied their dielectric properties with high-power sources in the millimeter wave range. The measurements have been performed using a broadband quasi-optical millimeter wave spectrometer with a backward wave oscillator (BWO) as a nondestructive high-power tunable source of coherent radiation. Values of real and imaginary parts of dielectric permittivity and loss tangent of the materials have been accurately calculated from the transmittance spectra.
Keywords :
backward wave oscillators; dielectric loss measurement; measurement errors; millimetre wave measurement; millimetre wave spectroscopy; permittivity measurement; plastics; BWO; backward wave oscillator; broadband quasioptical millimeter wave spectrometer; complex permittivity measurement; electrical insulating materials; error analysis; high dielectric strength thermoplastics; loss tangent measurement; nondestructive high-power tunable source; polymer-based thermoplastics; random error; systematic error; transmittance spectra; Dielectric breakdown; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Error analysis; Frequency measurement; Loss measurement; Millimeter wave measurements; Permittivity measurement; Complex dielectric permittivity; backward wave oscillator; loss tangent; quasi-optical spectrometer; thermoplastics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168705
Filename :
5168705
Link To Document :
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