DocumentCode
2600823
Title
Testing and reliability
fYear
2008
fDate
19-21 June 2008
Firstpage
473
Lastpage
474
Abstract
Start of the above-titled section of the conference proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on
Conference_Location
Poznan, Poland
Print_ISBN
978-83-922632-7-2
Type
conf
Filename
4600963
Link To Document