مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2600823

Title :

Testing and reliability

fYear :

2008

fDate :

19-21 June 2008

Firstpage :

473

Lastpage :

474

Abstract :

Start of the above-titled section of the conference proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on

Conference_Location :

Poznan, Poland

Print_ISBN :

978-83-922632-7-2

Type :

conf

Filename :

4600963

Link To Document :