Title :
Calibration of VFTO bushing sensor based on convolution model
Author :
Guo-Ming Ma ; Cheng-Rong Li ; Jiang-tao Quan ; Jian Jiang
Author_Institution :
Beijing Key Lab. of High Voltage, North China Electr. Power Univ., Beijing, China
Abstract :
Disconnector switching operations in large gas insulated switchgear (GIS) systems may cause very fast transients overvoltages (VFTO), which produce dielectric stress to transformer connecting with the disconnector. A VFTO bushing sensor is developed to measure the VFTO at the transformer entrance. Since the high frequency ratio of the bushing sensor is not constant, calibration before the field measurement is needed. Based on the convolution model and step response, a new calibration method is used to identify the frequency response of the bushing sensor. Calibration of an 110 kV rated bushing sensor is carried on in our laboratory to investigate the effectiveness of this method, and the calibrated results agree well with the amplitude-response gained by frequency sweep test, which demonstrates the calibrating method can be applied in VFTO bushing sensor calibration. Calibration of an UHV rated bushing sensor is processed in a factory and the frequency response of the sensor is given at the end of the paper.
Keywords :
calibration; convolution; electric sensing devices; frequency response; gas insulated switchgear; overvoltage; power transformer testing; transients; GIS system; UHV rated bushing sensor; VFTO bushing sensor calibration; convolution model; dielectric stress; disconnector switching operation; field measurement; frequency response; frequency sweep test; large gas insulated switchgear; step response; transformer; very fast transients overvoltage; voltage 110 kV; Calibration; Convolution; Dielectric measurements; Frequency response; Gas insulation; Geographic Information Systems; Insulators; Power transformer insulation; Surges; Switchgear; Convolution Model; Step Response; UHV Rated Bushing Sensor; VFTO;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168716