DocumentCode :
2600934
Title :
Interactive SRU diagnosis using neural networks
Author :
Allred, Lloyd G. ; Kirkland, Larry V.
Author_Institution :
Ogden Air Logistics Center, Hill AFB, UT, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
175
Lastpage :
180
Abstract :
The problem of repairing shop replaceable units (SRUs) is aggravated by the fact that most electrical components can be expected to exceed the service life requirements of the system in which they are embedded. It is not cost-effective to require testing time (and software development time) to diagnose failure modes which will probably never occur. In practice, the person repairing a circuit knows more about the circuit than anyone else, including the original developer of the diagnostic software. It is therefore desirable that meaningful diagnostic software be able to capture this expert knowledge as it becomes available to diagnose failure modes not anticipated in the original software development. To assist in this task, a user-friendly, menu-driven, artificially intelligent software program has been developed to assist the technician in diagnosing circuit card failures. As failures are diagnosed, the technician enters the corrective action as well as the essential failure and probing information. When similar failures are encountered in the future, the neural network diagnoses the most probable failure mode and directs the technician as to the information which would be useful in pinpointing the fault
Keywords :
artificial intelligence; automatic test equipment; automatic testing; electronic engineering computing; electronic equipment testing; failure analysis; interactive systems; neural nets; software engineering; user interfaces; ATE; VXIbus; artificial intelligence; circuit card failures; diagnostic software; failure modes; fault location; maintenance; menu driven software; neural networks; repair; service life; shop replaceable units; software development; Circuit faults; Circuit testing; Costs; Diagnostic expert systems; Hardware; Logistics; Neural networks; Programming; Software performance; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111509
Filename :
111509
Link To Document :
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