• DocumentCode
    2600934
  • Title

    Interactive SRU diagnosis using neural networks

  • Author

    Allred, Lloyd G. ; Kirkland, Larry V.

  • Author_Institution
    Ogden Air Logistics Center, Hill AFB, UT, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Firstpage
    175
  • Lastpage
    180
  • Abstract
    The problem of repairing shop replaceable units (SRUs) is aggravated by the fact that most electrical components can be expected to exceed the service life requirements of the system in which they are embedded. It is not cost-effective to require testing time (and software development time) to diagnose failure modes which will probably never occur. In practice, the person repairing a circuit knows more about the circuit than anyone else, including the original developer of the diagnostic software. It is therefore desirable that meaningful diagnostic software be able to capture this expert knowledge as it becomes available to diagnose failure modes not anticipated in the original software development. To assist in this task, a user-friendly, menu-driven, artificially intelligent software program has been developed to assist the technician in diagnosing circuit card failures. As failures are diagnosed, the technician enters the corrective action as well as the essential failure and probing information. When similar failures are encountered in the future, the neural network diagnoses the most probable failure mode and directs the technician as to the information which would be useful in pinpointing the fault
  • Keywords
    artificial intelligence; automatic test equipment; automatic testing; electronic engineering computing; electronic equipment testing; failure analysis; interactive systems; neural nets; software engineering; user interfaces; ATE; VXIbus; artificial intelligence; circuit card failures; diagnostic software; failure modes; fault location; maintenance; menu driven software; neural networks; repair; service life; shop replaceable units; software development; Circuit faults; Circuit testing; Costs; Diagnostic expert systems; Hardware; Logistics; Neural networks; Programming; Software performance; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
  • Conference_Location
    San Antonio, TX
  • Type

    conf

  • DOI
    10.1109/AUTEST.1990.111509
  • Filename
    111509