Title :
Causal Basis for System Failure Rate Calculations
Author_Institution :
Lockheed Palo Alto Research Laboratory, Palo Alto, California 94304
Keywords :
Arithmetic; Circuits and systems; Degradation; Exponential distribution; Feedback; Hazards; Laboratories; Reliability theory; Stress; Time factors;
Conference_Titel :
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IRPS.1967.362410
