DocumentCode
2601
Title
Self-Rectifying Resistive-Switching Device With
Bilayer
Author
Hangbing Lv ; Yingtao Li ; Qi Liu ; Shibing Long ; Ling Li ; Ming Liu
Author_Institution
Lab. of Nano-Fabrication & Novel Devices Integrated Technol., Inst. of Microelectron., Beijing, China
Volume
34
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
229
Lastpage
231
Abstract
Resistive switching with a self-rectifying feature is one of the most effective solutions to overcome the sneaking current issue in a crossbar structure. In this letter, we have successfully demonstrated a prototype device with inherent rectifying property with a-Si/WO3 bilayer structure. After a forming process, the devices exhibit obvious rectifying property with forward/reverse current ratio of 102 at ±0.75 V and excellent reproducibility. The formation of localized conductive filaments (CFs) in the WO3 layer and the corresponding CF/a-Si Schottky contact are suggested to explain the rectifying behavior. The results in this letter demonstrate a possible way to realize selector-free crossbar structure.
Keywords
Schottky barriers; elemental semiconductors; random-access storage; semiconductor switches; silicon; tungsten compounds; Schottky contact; Si-WO3; bilayer structure; forward-reverse current ratio; localized conductive filament formation; selector-free crossbar structure; self-rectifying BTMO RRAM device; self-rectifying resistive-switching device; Electrodes; Materials; Nanoscale devices; Resistance; Schottky barriers; Schottky diodes; Switches; Crossbar; resistive switching (RS); self-rectifying;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2012.2232640
Filename
6407728
Link To Document