DocumentCode

2601118

Title

Factors Affecting the Reliability of Wet Tantalum Capacitors

Author

Rowe, W.M. ; Eisenberg, P.H.

Author_Institution

Autonetics Division of North American Rockwell Corporation, Anaheim, California

fYear

1967

fDate

Nov. 1967

Firstpage

243

Lastpage

255

Keywords

Anodes; Capacitors; Cathodes; Circuits; Coatings; Dielectric devices; Manufacturing; Packaging; Physics; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1967. Sixth Annual

Conference_Location

Los Angeles, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1967.362417

Filename

4207780