Title :
Design of Electromagnetic Tomography system based on integrated impedance analyzer
Author :
Ze Liu ; Wuliang Yin ; Xiufang Sun
Author_Institution :
Sch. of Electron. Inf. & Eng., Beijing Jiaotong Univ., Beijing, China
Abstract :
An Electromagnetic Tomography (EMT) prototype system based on integrated impedance analyzer is proposed and developed in this paper. In the prototype system the excitation signal generation and measurement signal demodulation are both realized by using an integrated impedance analyzer IC controlled by an embedded microcontroller. The sensor is constructed with a parallel excitation layer, which is realized with flexible circuit strips as current sources, and coil detector array. The sensor simulation and image reconstruction experimental results of the prototype EMT system are also introduced. The experimental image reconstructions show that the prototype system can locate the distributions of test objects. This work provides a solution that the EMT system can be developed as an embedded instrument to meet the requirement of industrial environment.
Keywords :
demodulation; electric impedance measurement; electromagnetic devices; embedded systems; image reconstruction; microcontrollers; process monitoring; tomography; coil detector array; current source; electrical process tomography technique; electromagnetic tomography system; embedded microcontroller; excitation signal generation; flexible circuit strips; image reconstruction; industrial environment; industrial process monitoring; integrated impedance analyzer; measurement signal demodulation; parallel excitation layer; sensor simulation; Demodulation; Electromagnetic analysis; Electromagnetic measurements; Image reconstruction; Impedance measurement; Integrated circuit measurements; Prototypes; Sensor arrays; Signal generators; Tomography; Electromagnetic tomography; Embedded Instrument; Impedance anaylize; Sensor array; Signal demodulation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168734