DocumentCode :
2601530
Title :
"Moisture Resistance of Plastic Packages for Semiconductor Devices"
Author :
Fischer, F.
Author_Institution :
Siemens AG, Bereich Halbleiter, D 8 Mÿnchen 80, Ba¿anstrasse 73
fYear :
1970
fDate :
25659
Firstpage :
94
Lastpage :
100
Abstract :
The influence of processing on the moisture resistance of epoxies and silicones used for packaging semiconductor devices is investigated. Conditions are assumed analogou to a capacitor charging up through a series resistance, and it is shown that this model applies with sufficient accuracy for optimally processed plastic compounds. Deviations indicate incorrect procecsing. Based on the model, characteristic values for moisture permeability and moisture capacity are defined and their variations with the processing conditions discussed. It is shown how the moisture capacity and moisture resistance influence semiconductor devices, and the relationship between moisture parameters and other characteristic values of the plastic is indicated.
Keywords :
Absorption; Capacitors; Circuit testing; Materials reliability; Moisture; Permeability; Plastic packaging; Semiconductor device packaging; Semiconductor devices; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1970. 8th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1970.362440
Filename :
4207806
Link To Document :
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