DocumentCode :
2602308
Title :
First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming
Author :
Compagnoni, C. Monzio ; Spinelli, A.S. ; Gusmeroli, R. ; Lacaita, A.L. ; Beltrami, S. ; Ghetti, A. ; Visconti, A.
Author_Institution :
Politecnico di Milano, Milano
fYear :
2007
fDate :
10-12 Dec. 2007
Firstpage :
165
Lastpage :
168
Abstract :
We present for the first time the direct evidence of an injection statistical spread in the number of electrons placed into the floating-gate of deeply-scaled NAND Flash memories during constant-current Fowler-Nordheim programming. The spread directly affects the precision of the programmed levels and sets the ultimate accuracy of the NAND programming algorithm. Experimental results on technology nodes ranging from 90 nm to 60 nm reveal that the injection statistical spread increases as cell dimensions are reduced and this introduces a new constraint for future NAND memories design.
Keywords :
flash memories; NAND flash memories; constant-current Fowler-Nordheim programming; injection statistical spread; Capacitance; Character generation; Convergence; Current measurement; Displays; Electrons; Flash memory; Nonvolatile memory; Statistics; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
Type :
conf
DOI :
10.1109/IEDM.2007.4418892
Filename :
4418892
Link To Document :
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