DocumentCode

2602331

Title

Emitter Avalanche Currents in Gated Transistors

Author

Verwey, J.F.

Author_Institution

Philips Research Laboratories, N. V. Philips´´ Gloeilampenfabrieken, Eindhoven-Netherlands

fYear

1971

fDate

25993

Firstpage

16

Lastpage

24

Keywords

Avalanche breakdown; Boron; Breakdown voltage; Circuit stability; Current measurement; Electric breakdown; Electrons; Interface states; Laboratories; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1971. 9th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1971.362485

Filename

4207854