• DocumentCode
    2602434
  • Title

    The Response of the Threshold Voltages of the Transistors in Simple MOS Circuits to Tests at Elevated Temperatures

  • Author

    Reynolds, F.H.

  • Author_Institution
    Post Office Telecommunications Headquarters, London, England
  • fYear
    1971
  • fDate
    25993
  • Firstpage
    46
  • Lastpage
    56
  • Keywords
    Circuit testing; Integrated circuit testing; MOSFETs; Mathematical model; Procurement; Stress; Temperature dependence; Temperature distribution; Temperature measurement; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1971. 9th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1971.362491
  • Filename
    4207860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2602434