Title :
Reliability Studies of MOS Si-Gate Arrays
Author :
Fitzgerald, D.J. ; Parker, G.H. ; Spiegel, P.
Author_Institution :
Intel Corporation, Mountain View, California
Keywords :
Circuits; Current measurement; Decoding; PROM; Packaging; Power dissipation; Stress; Temperature; Time measurement; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1971.362492
