• DocumentCode
    2602455
  • Title

    Deriving voltage tolerance specification for processor circuit design

  • Author

    Zhou, Tingdong ; Friedrich, Joshua D. ; Becker, Wiren D.

  • Author_Institution
    IBM Syst. & Technol. Group, Austin, TX, USA
  • fYear
    2011
  • fDate
    23-26 Oct. 2011
  • Firstpage
    17
  • Lastpage
    20
  • Abstract
    A well defined power supply tolerance specification is very important for designing processor circuits with sufficient performance margin. We introduce a design flow to derive the voltage tolerance specification by including power noise components due to the significant contributors, namely, voltage drop, voltage gradient, middle frequency chip package resonance noise, high frequency simultaneous switching noise (SSN), and voltage regulation module (VRM) tolerance. This method has been serving well for power tolerance specifications of multiple generations of IBM processor designs. However, the methodology needs further refinement to design the off-chip serial interfaces. As the interfaces are increasing in frequency, the voltage levels and swings are minimized to meet the performance criteria of maximizing the data transfer rate per watt.
  • Keywords
    integrated circuit design; integrated circuit noise; integrated circuit packaging; microprocessor chips; power supply circuits; IBM processor designs; data transfer rate; high frequency simultaneous switching noise; middle frequency chip package resonance noise; off chip serial interface; power noise component; power supply tolerance; processor circuit design; voltage drop; voltage gradient; voltage regulation module tolerance; voltage tolerance specification; Capacitors; Jitter; Noise; Random access memory; Resistance; Resonant frequency; System-on-a-chip; Power integrity; voltage tolerance specification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-9398-2
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EPEPS.2011.6100174
  • Filename
    6100174