Title :
The Analysis of Data from Accelerated Stress Tests
Author_Institution :
Bell Telephone Laboratories, Allentown, Pennsylvania
Keywords :
Acceleration; Data analysis; Data handling; Failure analysis; Life estimation; Life testing; Semiconductor device testing; Silicon; Stress; Surface treatment;
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1971.362495
