DocumentCode :
2602564
Title :
Worst-Case Power-Constrained Noise for Binary-Input Channels
Author :
Shamai, Shlomo ; Verdú, Sergio
Author_Institution :
Dept. Electrical Eng., Technion, Israel
fYear :
1993
fDate :
17-22 Jan 1993
Firstpage :
262
Lastpage :
262
Keywords :
Atomic measurements; Capacity planning; Entropy; Error probability; Gaussian noise; Lattices; Random variables; Shape; Signal to noise ratio; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 1993. Proceedings. 1993 IEEE International Symposium on
Print_ISBN :
0-7803-0878-6
Type :
conf
DOI :
10.1109/ISIT.1993.748576
Filename :
748576
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2602564
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