• DocumentCode
    2602809
  • Title

    Reliability Considerations in the STD Development

  • Author

    Dietz, James P.

  • Author_Institution
    Electronics Laboratory, General Electric Company, Syracuse, New York
  • fYear
    1971
  • fDate
    25993
  • Firstpage
    211
  • Lastpage
    215
  • Abstract
    The structural features of the STD hybrid circuit building process are described. `Two features of this structure are unusual: first, the use of evaporated and electroplated metal contacts and, second, the use of a thermoplastic layer to separate two layers of metallization. Since the latter feature is unique to STD at this time, the adhesive properties of the plastic to the other circuit elements and the metal films to the plastic, together with the mechanical strains developed among the structural parts, are examined and discussed in detail. It is shown that the integral parts of the STD circuit adhere well and that the lateral strains, caused by thermal expansion, are insignificant. Also, any vertical strains in the system do not adversely affect contact continuity.
  • Keywords
    Buildings; Capacitive sensors; Circuits; Conducting materials; Conductors; Dielectric substrates; Laboratories; Metallization; Plastics; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1971. 9th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1971.362516
  • Filename
    4207885