DocumentCode
2602809
Title
Reliability Considerations in the STD Development
Author
Dietz, James P.
Author_Institution
Electronics Laboratory, General Electric Company, Syracuse, New York
fYear
1971
fDate
25993
Firstpage
211
Lastpage
215
Abstract
The structural features of the STD hybrid circuit building process are described. `Two features of this structure are unusual: first, the use of evaporated and electroplated metal contacts and, second, the use of a thermoplastic layer to separate two layers of metallization. Since the latter feature is unique to STD at this time, the adhesive properties of the plastic to the other circuit elements and the metal films to the plastic, together with the mechanical strains developed among the structural parts, are examined and discussed in detail. It is shown that the integral parts of the STD circuit adhere well and that the lateral strains, caused by thermal expansion, are insignificant. Also, any vertical strains in the system do not adversely affect contact continuity.
Keywords
Buildings; Capacitive sensors; Circuits; Conducting materials; Conductors; Dielectric substrates; Laboratories; Metallization; Plastics; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1971.362516
Filename
4207885
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