DocumentCode
2603226
Title
DEP-based fabrication and characterization of electronic-grade CNTs for nano-sensing applications
Author
Ouyang, Mengxing ; Sin, Mandy L Y ; Chow, Gary C T ; Li, Wen J. ; Han, Xuliang ; Janzen, Daniel C.
Author_Institution
Dept. of Mech. & Autom. Eng., Chinese Univ. of Hong Kong, Hong Kong
fYear
2007
fDate
2-5 Aug. 2007
Firstpage
1
Lastpage
6
Abstract
Sensing devices using electronic-grade carbon nanotubes (EG-CNTs) as resistive sensing element were fabricated by dielectrophoresis (DEP) manipulation. DEP-based fabrication of EG-CNTs is important as it allows some control of the nominal resistance of the fabricated sensors, which is essential to improve the SNR of CNT sensors. The devices were characterized and the potential of EG-CNTs to serve as a novel temperature and humidity sensing element has been demonstrated. Electrical characterization revealed that the EG-CNTs sensors, which exhibit large linear IiquestV range, have both positive and negative TCR at higher operational temperatures. In addition, its resistance-humidity linear dependency proves its humidity sensing capability. Moreover, the EG-CNTs device is capable of operating in nW range. On the foundation of these measurements, we aim to prove EG-CNTs as a promising material for future applications in nano-sensing.
Keywords
carbon nanotubes; electrical resistivity; electrophoresis; humidity sensors; microsensors; nanoelectronics; nanotube devices; temperature sensors; C; dielectrophoresis manipulation; electronic-grade carbon nanotubes; humidity sensing element; resistance; resistive sensing element; sensing devices; temperature sensing element; Carbon nanotubes; Chemical elements; Dielectrophoresis; Electric resistance; Electrical resistance measurement; Fabrication; Humidity; Sensor phenomena and characterization; Temperature distribution; Temperature sensors; Dielectrophoresis; Electronic-grade carbon nanotubes; Humidity sensor; Micro/nano sensing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-0607-4
Electronic_ISBN
978-1-4244-0608-1
Type
conf
DOI
10.1109/NANO.2007.4601128
Filename
4601128
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