DocumentCode :
2603346
Title :
Design of a high sensitivity capacitive force sensor
Author :
Chu, Henry K. ; Mills, James K. ; Cleghorn, William L.
Author_Institution :
Dept. of Mech. & Ind. Eng., Toronto Univ., Toronto, ON
fYear :
2007
fDate :
2-5 Aug. 2007
Firstpage :
29
Lastpage :
33
Abstract :
This paper presents the design and development of a MEMS based, capacitive sensor for micro-force measurement. The sensor has an overall dimension of 3600 mum times 1000 mum times 10 mum and was fabricated using the Micragem fabrication process. A displacement reduction mechanism is incorporated in this sensor design to increase the sensitivity of the sensor. Analysis from Finite Element software, COMSOL, confirms that a 10:1 displacement reduction ratio is achievable with this mechanism. Simulation results show that the sensor is capable of measuring a maximum force input of 11 milli-Newton, resulting from a 20-mum displacement on the sensing structure. A 6-DOF manipulator and an evaluation board were used to experimentally verify the performance the sensor. Experimental results show that a capacitance change of approximately 175 to 200 fF can be observed from a 20-mum displacement.
Keywords :
capacitive sensors; finite element analysis; force measurement; force sensors; microsensors; MEMS; Micragem fabrication; displacement reduction; finite element software; high sensitivity capacitive force sensor; manipulator; micro-force measurement; Capacitance; Capacitive sensors; Displacement measurement; Force measurement; Force sensors; Mechanical sensors; Mechanical variables measurement; Micromechanical devices; Optical sensors; Strain measurement; Capacitive; Displacement Reduction Mechanism; Force Sensor; MEMS; Micragem;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
Type :
conf
DOI :
10.1109/NANO.2007.4601134
Filename :
4601134
Link To Document :
بازگشت