DocumentCode :
2603449
Title :
Structural and optical properties of CuPc/ZnSe multilayer hybrid thin films prepared by electron beam evaporator
Author :
Thiwawong, Thutiyaporn ; Tunhoo, Benchapol ; Nukeaw, Jiti
Author_Institution :
Nanotechnol. Res. Center, King´´s Mongkut Inst. of Technol. Ladkrabang, Bangkok
fYear :
2007
fDate :
2-5 Aug. 2007
Firstpage :
58
Lastpage :
61
Abstract :
Multilayer hybrid thin films consisting of alternating layers of organic and inorganic materials were fabricated with powder of copper-phthalocyanine (CuPc) and zinc selenide (ZnSe) by electron beam evaporator. The structural and optical characterization of multilayer hybrid thin film were carried out by using X-ray diffraction (XRD), atomic force microscope (AFM) and UV-Vis absorption spectroscopy. XRD patterns show two peaks of the orientation of (200) plane monoclinic structure in CuPc material and (111) plane cubic structure in ZnSe material where pair numbers of multilayer hybrid thin film higher than two pairs. With the variation in the number of pairs of CuPc/ZnSe, AFM images present almost similar morphology but the optical absorption spectra are significantly changed. Such spectral changes can be interpreted by the effect of the aggregate size and the characteristic of the multilayer hybrid structure.
Keywords :
II-VI semiconductors; X-ray diffraction; aggregates (materials); atomic force microscopy; electron beam deposition; multilayers; organic semiconductors; organic-inorganic hybrid materials; powders; semiconductor growth; semiconductor thin films; ultraviolet spectra; vacuum deposition; visible spectra; wide band gap semiconductors; zinc compounds; UV absorption spectroscopy; X-ray diffraction; ZnSe; aggregate size; atomic force microscopy; copper phthalocyanine; electron beam evaporator; multilayer hybrid thin films; optical absorption spectra; optical properties; organic-inorganic materials; plane monoclinic structure; powder; structural properties; visible absorption spectroscopy; Atom optics; Atomic force microscopy; Electron beams; Electron optics; Nonhomogeneous media; Optical films; Optical microscopy; Transistors; X-ray scattering; Zinc compounds; multilayer hybrid thin films; organic- inorganic thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
Type :
conf
DOI :
10.1109/NANO.2007.4601140
Filename :
4601140
Link To Document :
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