DocumentCode
2603466
Title
Synthesis of well aligned silicon nanowire arrays by reflow of photoresist techniques
Author
Liu, Chien-Wei ; Kuo, Cheng-Yung ; Wang, Chuan-Po ; Gau, Chie ; Shiau, Shiuan-Hua ; Dai, Bau-Tong
Author_Institution
Southern Region Center, Nat. Nano Device Labs., Tainan
fYear
2007
fDate
2-5 Aug. 2007
Firstpage
62
Lastpage
65
Abstract
Well aligned Si nanowires (SiNWs) by Vapor-Liquid-Solid growth process are presented. Instead of using H2, the current work uses N2 as carrier gas. The growth conditions of SiNWs are controlled by the ratio of nitrogen versus silane gas. Tapering of nanowires was found at T=620degC and P=333 m torr, and the tapering parameter was reduced by increasing the N2 gas. Tapering of nanowires is attributed to volume reduction of Au catalyst which diffuses onto the side wall of nanowires. However, it is found that the N2 gas has a similar effect of O2 gas which can reduce diffusion of Au catalyst so that volume reduction of Au catalyst is not so significant and nanowire growth becomes untapered. By adopting reflow of photoresist techniques, the size of metal catalyst for SiNWs growth can be significantly reduced, and the growth location of SiNWs can be defined. Well aligned Si nanowires can be obtained. However, aspect ratio of the nano size hole in the photoresist after reflow has a significant effect on the amount of the Au in the nanoparticles and thus the quality and growth of the nanowires.
Keywords
catalysts; diffusion; elemental semiconductors; nanoparticles; nanotechnology; nanowires; photoresists; semiconductor growth; semiconductor quantum wires; silicon; Si; catalyst; diffusion; nanoparticles; photoresist reflow; pressure 333 mtorr; tapering parameter; temperature 620 degC; vapor-liquid-solid growth; well aligned nanowire arrays; Etching; Fluid flow; Gold; Hydrogen; Nanoscale devices; Nanotechnology; Nitrogen; Resists; Silicon; Substrates; Reflow of photoresist; SiNWs; Tapering; Vapor-Liquid-Solid;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-0607-4
Electronic_ISBN
978-1-4244-0608-1
Type
conf
DOI
10.1109/NANO.2007.4601141
Filename
4601141
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