• DocumentCode
    2603510
  • Title

    Cost-effective approach for reducing soft error failure rate in logic circuits

  • Author

    Mohanram, Kartik ; Touba, Nur A.

  • Author_Institution
    University of Texas at Austin
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    893
  • Lastpage
    901
  • Keywords
    Circuit faults; Computer errors; Concurrent computing; Costs; Error correction codes; Integrated circuit noise; Latches; Logic circuits; Mission critical systems; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271075
  • Filename
    1271075
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2603510