DocumentCode

2603707

Title

Overview of the IEEE P1500 standard

Author

Dasilva, Francisco ; Zorian, Yervant ; Whetsel, Lee ; Arabi, Karim ; Kapur, Rohit

Author_Institution

Synopsys, Inc.

Volume

1

fYear

2003

fDate

Sept. 30 2003-Oct. 2 2003

Firstpage

988

Lastpage

997

Keywords

Automatic testing; Design methodology; Design optimization; Hardware; IEEE standards; Instruments; Logic; Productivity; Registers;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

Conference_Location

Charlotte, NC, USA

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271086

Filename

1271086