• DocumentCode
    2603735
  • Title

    CAD model reconstruction of solder balls for the computationally efficient electromagnetic field simulation

  • Author

    Hillebrand, Jürgen ; Kiess, Steffen ; Wang, Yu ; Wróblewski, Marek ; Simon, Sven

  • Author_Institution
    Inst. of Parallel & Distrib. Syst., Univ. of Stuttgart, Stuttgart, Germany
  • fYear
    2011
  • fDate
    23-26 Oct. 2011
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    In this paper three different methods for reconstructing CAD models of solder balls based on 3D computed tomography (CT) data are discussed. The resulting CAD model contains accurate geometrical data of the device which can be used for an electromagnetic field simulation using the finite difference time domain (FDTD) method. This allows a non-instrusive evaluation of the electrical parameters of passive circuits, in this case for solder balls or bumps. All three reconstruction methods presented here will result in simulation meshes with a significantly reduced number of mesh cells compared to a simulation directly based on the original CT data. This leads to a significant reduction of both memory usage and simulation time which is important for complex packages.
  • Keywords
    CAD; computational electromagnetics; computerised tomography; electromagnetic fields; electronic engineering computing; electronics packaging; finite difference time-domain analysis; passive networks; solders; 3D computed tomography; CAD model reconstruction; complex package; computationally efficient electromagnetic field simulation; electrical parameters; finite difference time domain method; mesh cells; noninstrusive evaluation; passive circuits; solder balls; Approximation methods; Computational modeling; Computed tomography; Data models; Design automation; Integrated circuit modeling; Solid modeling; CAD model; Computed tomography; electromagnetic field simulation; scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-9398-2
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EPEPS.2011.6100246
  • Filename
    6100246