DocumentCode
2603785
Title
Utilization of matching score vector similarity measures in biometric systems
Author
Cheng, Xi ; Tulyakov, Sergey ; Govindaraju, Venu
Author_Institution
Center for Unified Biometrics & Sensors, Univ. at Buffalo, Buffalo, NY, USA
fYear
2012
fDate
16-21 June 2012
Firstpage
111
Lastpage
116
Abstract
In biometric systems, people may be asked to provide multiple scans for redundancy and quality control. In the case of fingerprint matching systems, repeat fingerprint probes of the same physical finger can be available and data from such multiple samples can be fused for reliable authentication of individuals. Since multiple samples are from the same instance of the finger, some relationships between them, e.g. diversity or similarity, could be observed. In this paper, we investigate such relationships and use them in fusion in order to improve the performance of biometric systems. The relationships between samples are derived by measuring the similarity between matching score vectors with Pearson´s correlation and cosine similarity measures. We conduct experiments using the FVC2002 dataset consisting of four fingerprint databases and trainable combination methods, likelihood ratio and multilayer perceptron. The results show that utilization of similarity measures for matching scores can further improve the multi-sample biometric fusion in both combination methods.
Keywords
biometrics (access control); fingerprint identification; image matching; multilayer perceptrons; visual databases; FVC2002 dataset; Pearsons correlation; biometric systems; combination methods; cosine similarity measurement; fingerprint databases; fingerprint matching systems; fingerprint probes; likelihood ratio; matching score vector similarity measurement; multilayer perceptron; multisample biometric fusion; physical finger; quality control; reliable authentication; Biometrics; Correlation; Current measurement; Databases; Face; Multilayer perceptrons; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2012 IEEE Computer Society Conference on
Conference_Location
Providence, RI
ISSN
2160-7508
Print_ISBN
978-1-4673-1611-8
Electronic_ISBN
2160-7508
Type
conf
DOI
10.1109/CVPRW.2012.6239224
Filename
6239224
Link To Document