• DocumentCode
    2603852
  • Title

    Atpg padding and ate vector repeat per port for reducing test data volume

  • Author

    Vranken, Harald ; Hapke, Friedrich ; Rogge, Soenke ; Chindamo, Domenico ; Volkerink, Erik

  • Author_Institution
    Agilent Technologies
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1069
  • Lastpage
    1078
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit testing; Clocks; Costs; Design methodology; Encoding; Integrated circuit testing; Pins; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271095
  • Filename
    1271095
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2603852