DocumentCode
2603868
Title
Analysis of Electrical Overstress Failures
Author
Smith, Jack S.
Author_Institution
Reliability Branch, Rome Air Development Center, Griffiss AFB NY 13441
fYear
1973
fDate
26755
Firstpage
105
Lastpage
107
Abstract
Electrical overstress microcircuit failures are a major cause of equipment malfunction. Visual cues for bidentifying overstress failures are discussed. In addition means for determining the current, voltage and pulse width magnitudes of the transient pulse which caused the failure are explained.
Keywords
Annealing; Contacts; Degradation; Electric variables; Failure analysis; Inspection; Metallization; Optical microscopy; Silicon; Space vector pulse width modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362579
Filename
4207954
Link To Document