DocumentCode
2603915
Title
A case study of ir-drop in structured at-speed testing
Author
Saxena, Jayashree ; Butler, Kenneth M. ; Jayaram, V.B. ; Kundu, Sandipan ; Arvind, N.V. ; Sreeprakash, Pravin ; Hachinger, M.
Author_Institution
Texas Instruments Inc.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1098
Lastpage
1104
Keywords
Application specific integrated circuits; Computer aided software engineering; Costs; Delay; Energy consumption; Packaging; Power dissipation; Pulp manufacturing; Test pattern generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271098
Filename
1271098
Link To Document