• DocumentCode
    2603925
  • Title

    Backplane test bus applications EEE STD 1149.1

  • Author

    Gibbs, Clayton

  • Author_Institution
    Texas Instruments, Inc.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1115
  • Lastpage
    1128
  • Keywords
    Backplanes; Circuit testing; Controllability; Integrated circuit packaging; Logic devices; Logic testing; Printed circuits; Programmable logic arrays; Programmable logic devices; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271100
  • Filename
    1271100
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2603925