A typical defect in the Bridgman-grown LBO crystals

Author

Fan, Shi-ji ; Sun, Ren-ying ; Xu, Jia-Yue ; Zhang, Guang-Yu ; Lin, Ya-fang

Author_Institution

Inst. of Ceramics, Acad. Sinica, Shanghai, China

fYear

1997

fDate

28-30 May 1997

Firstpage

536

Lastpage

539

Abstract

A typical macro-defect, a veil-like layer in the Bridgman-grown ⟨110⟩ LBO crystals, was discovered. The veil-like layer seems to be a semi-transparent veil which covers the whole or partial cross section in the growth direction. The mechanism for formation of the veil-like layer defect has been explored by determining morphology and distribution of the defect and analyzing the relationship between the crystal growth conditions and the defect. The veil-like layer defect is microcrack in which there is decomposition on surface of the crack or deposition of vapor of LBO melt in as-grown LBO crystals

Keywords

acoustic materials; crystal defects; crystal growth from melt; lithium compounds; microcracks; piezoelectric materials; surface acoustic wave resonator filters; Bridgman-grown crystals; Li₂B₄O₇; SAW devices; crack surface; crystal growth conditions; macro-defect; microcrack; partial cross section; piezoelectric materials; semi-transparent veil; veil-like layer; Crystalline materials; Crystals; Furnaces; Optical filters; Optical surface waves; Surface acoustic wave devices; Surface acoustic waves; Surface cracks; Surface morphology; Temperature control;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International

Conference_Location

Orlando, FL

Print_ISBN

0-7803-3728-X

Type

conf

DOI

10.1109/FREQ.1997.638655

Filename

638655